Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, Daisuke Fujimoto, Makoto Nagata, Toshihiro Katashita, Jean-Luc Danger, Takafumi Aoki. A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation. IEEE Trans. VLSI Syst., 23(8):1429-1438, 2015. [doi]
Abstract is missing.