An on-chip glitchy-clock generator for testing fault injection attacks

Sho Endo, Takeshi Sugawara, Naofumi Homma, Takafumi Aoki, Akashi Satoh. An on-chip glitchy-clock generator for testing fault injection attacks. J. Cryptographic Engineering, 1(4):265-270, 2011. [doi]

Abstract

Abstract is missing.