A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes

Maki Endo, Kosuke Tsuruta, Soichiro Kita, Hiroshi Nakajima. A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Singapore, 12-15 October 2008. pages 2099-2104, IEEE, 2008. [doi]