Ki-Jin Eom, Choong-Hyun Choi, Joon-Young Paik, Eun-Sun Cho. An Efficient Static Taint-Analysis Detecting Exploitable-Points on ARM Binaries. In 33rd IEEE International Symposium on Reliable Distributed Systems, SRDS 2014, Nara, Japan, October 6-9, 2014. pages 345-346, IEEE, 2014. [doi]
Abstract is missing.