Erdem Serkan Erdogan, Sule Ozev. An ADC-BiST scheme using sequential code analysis. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 713-718, ACM, 2007. [doi]
Abstract is missing.