Up-to Techniques for Branching Bisimilarity

Rick Erkens, Jurriaan Rot, Bas Luttik. Up-to Techniques for Branching Bisimilarity. In Alexander Chatzigeorgiou, Riccardo Dondi, Herodotos Herodotou, Christos A. Kapoutsis, Yannis Manolopoulos, George A. Papadopoulos, Florian Sikora, editors, SOFSEM 2020: Theory and Practice of Computer Science - 46th International Conference on Current Trends in Theory and Practice of Informatics, SOFSEM 2020, Limassol, Cyprus, January 20-24, 2020, Proceedings. Volume 12011 of Lecture Notes in Computer Science, pages 285-297, Springer, 2020. [doi]

Authors

Rick Erkens

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Jurriaan Rot

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Bas Luttik

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