Peter Ersland, Roberto Menozzi. Editorial. Microelectronics Reliability, 83:206, 2018. [doi]
@article{ErslandM18,
title = {Editorial},
author = {Peter Ersland and Roberto Menozzi},
year = {2018},
doi = {10.1016/j.microrel.2018.02.020},
url = {https://doi.org/10.1016/j.microrel.2018.02.020},
researchr = {https://researchr.org/publication/ErslandM18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {83},
pages = {206},
}