Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-7, IEEE, 2017. [doi]
Abstract is missing.