Samuel Evain, Yannick Bonhomme, Valentin Gherman. Programmable restricted SEC codes to mask permanent faults in semiconductor memories. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 147-153, IEEE, 2010. [doi]
@inproceedings{EvainBG10,
title = {Programmable restricted SEC codes to mask permanent faults in semiconductor memories},
author = {Samuel Evain and Yannick Bonhomme and Valentin Gherman},
year = {2010},
doi = {10.1109/IOLTS.2010.5560216},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560216},
researchr = {https://researchr.org/publication/EvainBG10},
cites = {0},
citedby = {0},
pages = {147-153},
booktitle = {16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece},
publisher = {IEEE},
isbn = {978-1-4244-7724-1},
}