Programmable restricted SEC codes to mask permanent faults in semiconductor memories - researchr publication related

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Samuel Evain, Yannick Bonhomme, Valentin Gherman. Programmable restricted SEC codes to mask permanent faults in semiconductor memories. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 147-153, IEEE, 2010. [doi]

The following publications are possibly variants of this publication:

Programmable extended SEC-DED codes for memory errorsValentin Gherman, Samuel Evain, Fabrice Auzanneau, Yannick Bonhomme. vts 2011: 140-145 [doi]

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