Techniques for heavy ion microbeam analysis of FPGA SER sensitivty

Adrian Evans, Dan Alexandrescu, Veronique Ferlet-Cavrois, Kay-Obbe Voss. Techniques for heavy ion microbeam analysis of FPGA SER sensitivty. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]

Abstract

Abstract is missing.