Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis. Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 727-732, IEEE, 2013. [doi]
Abstract is missing.