On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs

M. A. Exarchos, François Dieudonné, Jalal Jomaah, G. J. Papaioannou, Francis Balestra. On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectronics Reliability, 44(9-11):1643-1647, 2004. [doi]

Abstract

Abstract is missing.