The following publications are possibly variants of this publication:
- Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETsM. A. Exarchos, G. J. Papaioannou, Jalal Jomaah, Francis Balestra. mr, 49(9-11):1018-1023, 2009. [doi]
- An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET sF. Dieudonné, F. Daugé, J. Jomaah, C. Raynaud, F. Balestra. mr, 41(9-10):1417-1420, 2001.