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M. A. Exarchos, G. J. Papaioannou, J. Jomaah, F. Balestra. The impact of static and dynamic degradation on SOI smart-cut floating body MOSFETs. Microelectronics Reliability, 45(9-11):1386-1389, 2005. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETsM. A. Exarchos, G. J. Papaioannou, Jalal Jomaah, Francis Balestra. mr, 49(9-11):1018-1023, 2009. [doi]
The following publications are possibly variants of this publication: