The impact of static and dynamic degradation on SOI smart-cut floating body MOSFETs

M. A. Exarchos, G. J. Papaioannou, J. Jomaah, F. Balestra. The impact of static and dynamic degradation on SOI smart-cut floating body MOSFETs. Microelectronics Reliability, 45(9-11):1386-1389, 2005. [doi]

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