Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs

M. A. Exarchos, G. J. Papaioannou, Jalal Jomaah, Francis Balestra. Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. Microelectronics Reliability, 49(9-11):1018-1023, 2009. [doi]

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