External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Tags

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Charging of radiation induced defects in RF MEMS dielectric films

M. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, R. Plana. Charging of radiation induced defects in RF MEMS dielectric films. Microelectronics Reliability, 46(9-11):1695-1699, 2006. [doi]

Authors

M. Exarchos

This author has not been identified. Look up 'M. Exarchos' in Google

E. Papandreou

This author has not been identified. Look up 'E. Papandreou' in Google

P. Pons

This author has not been identified. Look up 'P. Pons' in Google

M. Lamhamdi

This author has not been identified. Look up 'M. Lamhamdi' in Google

G. J. Papaioannou

This author has not been identified. Look up 'G. J. Papaioannou' in Google

R. Plana

This author has not been identified. Look up 'R. Plana' in Google
runs on