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M. Exarchos, V. Theonas, P. Pons, G. J. Papaioannou, S. Mellé, D. Dubuc, F. Cocetti, R. Plana. Investigation of charging mechanisms in metal-insulator-metal structures. Microelectronics Reliability, 45(9-11):1782-1785, 2005. [doi]
Abstract is missing.