Micky Faas, Matthijs van Leeuwen. Vouw: Geometric Pattern Mining Using the MDL Principle. In Michael R. Berthold, Ad Feelders, Georg Krempl, editors, Advances in Intelligent Data Analysis XVIII - 18th International Symposium on Intelligent Data Analysis, IDA 2020, Konstanz, Germany, April 27-29, 2020, Proceedings. Volume 12080 of Lecture Notes in Computer Science, pages 158-170, Springer, 2020. [doi]
Abstract is missing.