Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs

M. Fadlallah, G. Ghibaudo, J. Jomaah, M. Zoaeter, G. Gu├ęgan. Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability, 42(1):41-46, 2002. [doi]

Abstract

Abstract is missing.