Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs

M. Fadlallah, G. Ghibaudo, J. Jomaah, M. Zoaeter, G. Guégan. Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability, 42(1):41-46, 2002. [doi]

Authors

M. Fadlallah

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G. Ghibaudo

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J. Jomaah

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M. Zoaeter

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G. Guégan

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