Chih-Min Fan, Yun-Pei Lu. A Bayesian framework to integrate knowledge-based and data-driven inference tools for reliable yield diagnoses. In Scott J. Mason, Raymond R. Hill, Lars Mönch, Oliver Rose, Thomas Jefferson, John W. Fowler, editors, Proceedings of the 2008 Winter Simulation Conference, Global Gateway to Discovery, WSC 2008, InterContinental Hotel, Miami, Florida, USA, December 7-10, 2008. pages 2323-2329, WSC, 2008. [doi]
Abstract is missing.