Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process

Ji Fan, Tao Liu 0002, Yongcan Shuang, Bo Song, Junghui Chen, Yonghong Tan. Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process. IEEE T. Instrumentation and Measurement, 72:1-14, 2023. [doi]

Authors

Ji Fan

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Tao Liu 0002

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Yongcan Shuang

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Bo Song

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Junghui Chen

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Yonghong Tan

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