Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process

Ji Fan, Tao Liu 0002, Yongcan Shuang, Bo Song, Junghui Chen, Yonghong Tan. Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process. IEEE T. Instrumentation and Measurement, 72:1-14, 2023. [doi]

@article{FanLSSCT23,
  title = {Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process},
  author = {Ji Fan and Tao Liu 0002 and Yongcan Shuang and Bo Song and Junghui Chen and Yonghong Tan},
  year = {2023},
  doi = {10.1109/TIM.2023.3330217},
  url = {https://doi.org/10.1109/TIM.2023.3330217},
  researchr = {https://researchr.org/publication/FanLSSCT23},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {72},
  pages = {1-14},
}