Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong. Statistical model order reduction for interconnect circuits considering spatial correlations. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1508-1513, ACM, 2007. [doi]
Abstract is missing.