Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti. RT-Level Deviation-Based Grading of Functional Test Sequences. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 264-269, IEEE Computer Society, 2009. [doi]
Abstract is missing.