Bahareh J. Farahani, Ali Azarpeyvand, Saeed Safari, Seid Mehdi Fakhraie. Reliability-aware cross-layer custom instruction screening. In Lukás Sekanina, Görschwin Fey, Jaan Raik, Snorre Aunet, Richard Ruzicka, editors, 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013. pages 258-262, IEEE Computer Society, 2013. [doi]
Abstract is missing.