Cost-effective analysis of post-silicon functional coverage events

Farimah Farahmandi, Ronny Morad, Avi Ziv, Ziv Nevo, Prabhat Mishra. Cost-effective analysis of post-silicon functional coverage events. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 392-397, IEEE, 2017. [doi]

Abstract

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