A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs

Michele Favalli, Bruno Riccò, L. Penza. A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 599, IEEE Computer Society, 1995. [doi]

Abstract

Abstract is missing.