Maximilian W. Feil, Hans Reisinger, André Kabakow, Thomas Aichinger, Wolfgang Gustin, Tibor Grasser. Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3, IEEE, 2022. [doi]
Abstract is missing.