Derek Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly. Current sensing for built-in testing of CMOS circuits. In Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988. pages 454-457, IEEE, 1988. [doi]
Abstract is missing.