A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior

Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon. A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Transactions, 94-C(12):1906-1908, 2011. [doi]

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