17.4 CMOS impedance analyzer for nanosamples investigation operating up to 150MHz with Sub-aF resolution

Giorgio Ferrari, Davide Bianchi, Angelo Rottigni, Marco Sampietro. 17.4 CMOS impedance analyzer for nanosamples investigation operating up to 150MHz with Sub-aF resolution. In 2014 IEEE International Conference on Solid-State Circuits Conference, ISSCC 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014. pages 292-293, IEEE, 2014. [doi]

Abstract

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