Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman. Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 140-145, IEEE Computer Society, 2009. [doi]
Abstract is missing.