Memory corruption attacks within Android TEEs: a case study based on OP-TEE

Fabian Fleischer, Marcel Busch, Phillip Kuhrt. Memory corruption attacks within Android TEEs: a case study based on OP-TEE. In Melanie Volkamer, Christian Wressnegger, editors, ARES 2020: The 15th International Conference on Availability, Reliability and Security, Virtual Event, Ireland, August 25-28, 2020. ACM, 2020. [doi]

Abstract

Abstract is missing.