Karine Florent, A. Subirats, Simone Lavizzari, Robin Degraeve, U. Celano, Ben Kaczer, Luca Di Piazza, Mihaela Popovici, Guido Groeseneken, Jan Van Houdt. Investigation of the endurance of FE-HfO2 devices by means of TDDB studies. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6, IEEE, 2018. [doi]
Abstract is missing.