Fabrication and Characterization of nanowires by Atomic Force Microscope Lithography

L. M. Fok, Y. H. Liu, W. J. Li. Fabrication and Characterization of nanowires by Atomic Force Microscope Lithography. In 2006 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2006, October 9-15, 2006, Beijing, China. pages 1927-1932, IEEE, 2006. [doi]

Abstract

Abstract is missing.