Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine. Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. J. Electronic Testing, 28(3):317-329, 2012. [doi]

Abstract

Abstract is missing.