Pierre Formont, Jean Philippe Ovarlez, Frédéric Pascal 0001, Gabriel Vasile, Laurent Ferro-Famil. A test statistic for high resolution polarimetric SAR data classification. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings. pages 1871-1874, IEEE, 2010. [doi]
Abstract is missing.