Simulation and modeling of dielectric barrier impact on heterogeneous electric field

Elham Foruzan, Amir A. S. Akmal, Kaveh Niayesh, Jeremy Lin, Desh Deepak Sharma, Hossein Sangrody. Simulation and modeling of dielectric barrier impact on heterogeneous electric field. In IEEE International Conference on Electro Information Technology, EIT 2017, Lincoln, NE, USA, May 14-17, 2017. pages 71-76, IEEE, 2017. [doi]

Abstract

Abstract is missing.