Generation of Incompliete Test-Data usinng Bayesinan Networks

Olivier François, Philippe Leray. Generation of Incompliete Test-Data usinng Bayesinan Networks. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2007, Celebrating 20 years of neural networks, Orlando, Florida, USA, August 12-17, 2007. pages 2391-2396, IEEE, 2007. [doi]

Abstract

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