Statistical Analysis of ENOB and Yield in Binary Weighted ADCs and DACS With Random Element Mismatch

Jeffrey Fredenburg, Michael P. Flynn. Statistical Analysis of ENOB and Yield in Binary Weighted ADCs and DACS With Random Element Mismatch. IEEE Trans. on Circuits and Systems, 59-I(7):1396-1408, 2012. [doi]

Abstract

Abstract is missing.