Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry

Benedikt Friederich, Dilyan Damyanov, Jan C. Balzer, Thorsten Schultze. Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry. IEEE Access, 8:186138-186147, 2020. [doi]

Abstract

Abstract is missing.