Qingqin Fu, Jun Liu, Rui Nie, Zhengquan Ang, Jia Liu, Zheng Li, Ling Yi, Pingjiang Xu, Yujie Shi, Zhaoqing Liang, Jiahui Yuan. Research on a Security Chip Power-Down Test Method Based on MP300 Device. In Antonio J. Tallón-Ballesteros, editor, Fuzzy Systems and Data Mining V - Proceedings of FSDM 2019, Kitakyushu City, Japan, October 18-21, 2019. Volume 320 of Frontiers in Artificial Intelligence and Applications, pages 870-875, IOS Press, 2019. [doi]
Abstract is missing.