Tasuku Fujibe, Kazuki Shirahata, Takeshi Mizushima, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda. An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-2, IEEE, 2016. [doi]
Abstract is missing.