Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage

Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yohei Hori, Toshihiro Katashita, Kazuo Sakiyama, Thanh-Ha Le, Julien Bringer, Pirouz Bazargan-Sabet, Shivam Bhasin, Jean-Luc Danger. Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage. IEICE Transactions, 97-C(4):272-279, 2014. [doi]

Abstract

Abstract is missing.