Daisuke Fujimoto, Daichi Tanaka, Noriyuki Miura, Makoto Nagata, Yu-ichi Hayashi, Naofumi Homma, Shivam Bhasin, Jean-Luc Danger. Side-channel leakage on silicon substrate of CMOS cryptographic chip. In 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2013, Arlington, VA, USA, May 6-7, 2014. pages 32-37, IEEE, 2014. [doi]
Abstract is missing.