Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue. A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013. pages 85-90, IEEE, 2013. [doi]
Abstract is missing.