Novel metrics for Analog Mixed-Signal coverage

Andreas Furtig, Georg Glaeser, Christoph Grimm 0001, Lars Hedrich, Stefan Heinen, Hyun-Sek Lukas Lee, Gregor Nitsche, Markus Olbrich, Carna Radojicic, Fabian Speicher. Novel metrics for Analog Mixed-Signal coverage. In Manfred Dietrich, Ondrej Novák, editors, 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017. pages 97-102, IEEE, 2017. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.