Jun Furuta, Ryosuke Yamamoto, Kazutoshi Kobayashi, Hidetoshi Onodera. Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2011, Jeju, South Korea, November 14-16, 2011. pages 209-212, IEEE, 2011. [doi]
Abstract is missing.